Minutes, IBIS Quality Committee 09 February 2010 11-12 AM EST (8-9 AM PST) ROLL CALL Adam Tambone * Anders Ekholm, Ericsson Barry Katz, SiSoft Benny Lazer Benjamin P Silva Bob Cox, Micron * Bob Ross, Teraspeed Consulting Group Brian Arsenault David Banas, Xilinx * Eckhard Lenski, Nokia Siemens Networks Eric Brock Guan Tao, Huawei Technologies Gregory R Edlund Hazem Hegazy Huang Chunxing, Huawei Technologies John Figueroa John Angulo, Mentor Graphics Katja Koller, Nokia Siemens Networks Kevin Fisher Kim Helliwell, LSI Logic Lance Wang, IOMethodology Lijun, Huawei Lynne Green, Green Streak Programs * Mike LaBonte, Cisco Systems Mike Mayer, SiSoft * Moshiul Haque, Micron Technology Muniswarareddy Vorugu, ARM Ltd * Pavani Jella, TI Peter LaFlamme Randy Wolff, Micron Technology Radovan Vuletic, Qimonda Robert Haller, Enterasys Roy Leventhal, Leventhal Design & Communications Sherif Hammad, Mentor Graphics Tim Coyle, Signal Consulting Group Todd Westerhoff, SiSoft Tom Dagostino, Teraspeed Consulting Group Kazuyoshi Shoji, Hitachi Sadahiro Nonoyama Everyone in attendance marked by * NOTE: "AR" = Action Required. -----------------------MINUTES --------------------------- Mike LaBonte conducted the meeting. Call for opens and patent disclosures: - No one declared a patent. - Anders: We should look at Bruce Archambeault correlation work - FSV - Maybe it could go on the IQ website somehow - IEEE copyright, not freely available AR Review: - Mike start correlation handbook outline - Pavani helped - Mike add MS 2003 format files to IQ checklist upload - Done New items: Mike showed a starter outline for a correlation handbook - Pavani and Mike created this last week - Bob: Pre-emphasis is more general than differential - Also true differential doesn't relate much to IBIS - Anders: External models can do it Mike showed IEEE draft FSV document from Bruce Archambeault - Bob: Our document might include system correlation per Huawei - Mike: We need a language to send reference measurements to model makers - Golden waveforms can send from IC makers to end users - We need a more extensive interconnect language for systems - Then reference measurements could be sent to IC makers - Bob: It's not the IC maker's job to debug your design - Mike: They probably would be interested - Mike: Section 7 discusses FSV - It seems to define a score - Bob: We still need to look at David Banas' presentation - Yuri Schlepnev also provided percent metrics - We discussed tests for passivity and causality in Touchstone - Yuri has done that - Mike: Dimensionless scores can be helpful - But they don't help predict timing analysis errors - Also errors can be frequency related - Bob: Every method has it's good and bad points - This IEEE document might be a good normative reference - Mike: Has there been any work on this since June 2008? - Bob: Bruce may be interested in pursuing this - Sometimes public access is granted to these documents AR: Anders contact Bruce Archambeault about IEEE P1597.1 and IQ participation Discussion of summit: - Bob: Randy gave a good checklist presentation - Arpad asked if summary scoring could be automated - The variable number of sheets is the issue for that - MS Excel has limitations in what it can do across sheets - Bob: Lynne talked about model review AR: Mike post link to Randy and Moshiul's presentation Next meeting will be Feb 16 Meeting ended at 12:05 PM Eastern Time.